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Wear resistance of superior structural WS2-Sb2O3/Cu nanoscale multilayer film 期刊论文
Materials & design, 2016, 卷号: 93, 页码: 494-502
Authors:  Xu SS(徐书生);  Zheng JY(郑建云);  Hao JY(郝俊英);  Kong LG(孔良桂);  Liu WM(刘维民);  Hao JY(郝俊英);  Liu WM(刘维民)
Adobe PDF(3644Kb)  |  Favorite  |  View/Download：292/7  |  Submit date：2016/01/22
Ws2 Based Film  Sb2o3 Doping  Cu Sublayer  Nanostructure  Wear Resistance  
Properties of a-C:H:Si thin films deposited by middle-frequency magnetron sputtering 期刊论文
Applied Surface Science, 2016, 卷号: 379, 页码: 516-522
Authors:  Jiang JL(姜金龙);  Wang, Yubao;  Du, Jinfang;  Yang, Hua;  Hao JY(郝俊英);  Jiang JL(姜金龙);  Hao JY(郝俊英)
Adobe PDF(1973Kb)  |  Favorite  |  View/Download：120/0  |  Submit date：2016/07/11
A-c:h:Si Films  Magnetron Sputtering  Structure  Tribological Properties  
Comparative study on structure and properties of titanium/silicon mono- and co-doped amorphous carbon films deposited by mid-frequency magnetron sputtering 期刊论文
Surface and Interface Analysis, 2014, 卷号: 46, 期号: 3, 页码: 139-144
Authors:  Jiang JL(姜金龙);  Huang H(黄浩);  Wang Q(王琼);  Zhu WJ(朱伟军);  Hao JY(郝俊英);  Liu WM(刘维民);  Jiang JL(姜金龙)
Adobe PDF(385Kb)  |  Favorite  |  View/Download：296/3  |  Submit date：2014/12/17
A-c:h Films  Co-doping  Microstructure  Tribological Properties  
Influence of Applied Bias Voltage on the Composition, Structure, and Properties of Ti:Si-Codoped a-C:H Films Prepared by Magnetron Sputtering 期刊论文
Journal of Nanomaterials, 2014, 页码: 937068-7
Authors:  Jiang JL(姜金龙);  Wang Q(王琼);  Wang YB(王玉宝);  Zhang X(张霞);  Yang H(杨华);  Hao JY(郝俊英);  Jiang JL(姜金龙)
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Effect of N2/CH4 flow ratio on microstructure and composition of hydrogenated carbon nitride films prepared by a dual DC-RF plasma system 期刊论文
Journal of Non-Crystalline Solids, 2007, 卷号: 353, 页码: 136-142
Authors:  Hao JY(郝俊英);  Liu WM(刘维民);  Xue QJ(薛群基)
Adobe PDF(201Kb)  |  Favorite  |  View/Download：270/2  |  Submit date：2013/11/01
Films And Coatings  Chemical Vapor Deposition  Plasma Deposition  Vapor Phase Deposition  Hardness  Indentation  Microindentation  Microstructure  Ftir Measurements  Xps