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Improved wear resistance of WS2 film by LT-deposited Ti interlayer with ω phase structure 期刊论文
Vacuum, 2018, 卷号: 155, 期号: 1, 页码: 423-427
Authors:  Gao XM(高晓明);  Sun JY(孙嘉奕);  Fu YL(伏彦龙);  Jiang D(姜栋);  Wang DS(王德生);  Weng LJ(翁立军);  Hu M(胡明)
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Tailoring of the interface morphology of WS 2 /CrN bilayered thin film for enhanced tribological property 期刊论文
Vacuum, 2018, 卷号: 156, 期号: 10, 页码: 157-164
Authors:  Wang DS(王德生);  Hu M(胡明);  Gao XM(高晓明);  Jiang D(姜栋);  Fu YL(伏彦龙);  Weng LJ(翁立军);  Sun JY(孙嘉奕)
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The improved corrosion resistance of sputtered CrN thin films with Cr-ion bombardment layer by layer 期刊论文
Vacuum, 2017, 卷号: 143, 页码: 329-335
Authors:  Wang DS(王德生);  Hu M(胡明);  Jiang D(姜栋);  Fu YL(伏彦龙);  Wang QQ(王琴琴);  Yang J(杨军);  Sun JY(孙嘉奕);  Weng LJ(翁立军)
Adobe PDF(1566Kb)  |  Favorite  |  View/Download:81/2  |  Submit date:2017/11/24
Corrosion Behavior  Ion Bombardment  Crn Film  Sputtering  Filtered Arc Ion Plating  
Response of RF-sputtered MoS2 composite films to LEO space environment 期刊论文
Vacuum, 2017, 卷号: 144, 页码: 72-79
Authors:  Gao XM(高晓明);  Hu M(胡明);  Sun JY(孙嘉奕);  Fu YL(伏彦龙);  Yang J(杨军);  Liu WM(刘维民);  Weng LJ(翁立军);  Weng LJ(翁立军);  Hu M(胡明);  Sun JY(孙嘉奕)
Adobe PDF(2101Kb)  |  Favorite  |  View/Download:124/4  |  Submit date:2017/11/19
Leo  Atomic Oxygen  Mos2 Films  
The role of trace Ti concentration on the evolution of microstructure and properties of duplex doped Ti(Ag)/DLC films 期刊论文
Vacuum, 2015, 卷号: 115, 页码: 23-30
Authors:  Ji L(吉利);  Wu YX(吴艳霞);  Li HX(李红轩);  Song H(宋惠);  Liu XH(刘晓红);  Ye YP(冶银平);  Chen JM(陈建敏);  Zhou HD(周惠娣);  Liu, Liu;  Ji L(吉利);  Li HX(李红轩)
Adobe PDF(2137Kb)  |  Favorite  |  View/Download:189/0  |  Submit date:2015/10/28
Ti(Ag)/a-c:h Film  Microstructure  Mechanical Properties  Tribological Properties  
Low temperature preparation of transparent, antireflective TiO2 films deposited at different O-2/Ar ratios by microwave electron cyclotron resonance magnetron sputtering 期刊论文
Vacuum, 2012, 卷号: 86, 期号: 9, 页码: 1387-1392
Authors:  Du W(杜雯);  Ye YP(冶银平);  Li HX(李红轩);  Zhao F(赵飞);  Ji L(吉利);  Quan WL(权伟龙);  Chen JM(陈建敏);  Zhou HD(周惠娣);  Chen JM(陈建敏)
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Titanium Oxide Thin Film  Mw-ecr  O-2/ar Ratio  Antireflection