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| 测量薄膜摩擦学性能的装置 专利 专利类型: 实用新型, 专利号: 200620164948.1, 申请日期: 2008-01-16, 公开日期: 2008-01-16 Inventors: 白明武; 张亚丽; 庞重军 Adobe PDF(430Kb)  |  Favorite  |  View/Download:174/5  |  Submit date:2013/06/21 |
| Tribological evaluation of α,ώ-diimidazoliumalkylene hexafluorophosphate ionic liquid and benzotriazole as additive 期刊论文 Tribology International, 2008, 卷号: 41, 页码: 797-801 Authors: 于波(男); Zhou F(周峰); Pang ZJ(庞重军); Wang B(王博); Liang YM(梁永民); Liu WM(刘维民) Adobe PDF(405Kb)  |  Favorite  |  View/Download:146/1  |  Submit date:2013/05/24 Ionic Liquid Lubricant Additive Corrosion Wear |
| 角分辨XPS测定极薄金膜的厚度和覆盖率 期刊论文 材料科学与工程学报, 2007, 卷号: 25, 期号: 3, 页码: 349-352 Authors: 庞重军; 白明武; 严洁; 王博; 林义民 Adobe PDF(306Kb)  |  Favorite  |  View/Download:239/0  |  Submit date:2013/11/01 材料检测与分析技术 薄膜厚度 覆盖率 Arxps 金膜 Measuring And Analysis For Materials Thin-film Thickness Coverage Rate Gold Film |
| Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy 期刊论文 Applied Surface Science, 2007, 卷号: 253, 页码: 4688-4693 Authors: Pang ZJ(庞重军); Bai MW(白明武) Adobe PDF(219Kb)  |  Favorite  |  View/Download:50/0  |  Submit date:2013/11/01 Thickness Determination Metrology Angle-dependent Xps Lubricant Perfluoropolyether |
| Preparation and tribological properties of multiply-alkylated cyclopentane (MAC)–octadecyltrichlorosilane (OTS) double-layer film on silicon 期刊论文 Wear, 2007, 卷号: 263, 页码: 1000-1007 Authors: 马剑琪; 庞重军; 莫宇飞; 白明武 Adobe PDF(1076Kb)  |  Favorite  |  View/Download:226/0  |  Submit date:2013/11/01 Tribology Mac Ots Sam Durability |
| 化学结构化硅面表OTS自组装膜形貌及性能表征 期刊论文 润滑与密封, 2007, 卷号: 32, 期号: 11, 页码: 112-114 Authors: 庞重军; 于波(男); 宋仕永; 巩育军 Adobe PDF(495Kb)  |  Favorite  |  View/Download:172/0  |  Submit date:2013/11/01 薄膜 自组装 Ots 形貌 性能表征 Thin Film Self-assembled Monolayer Topography Performance Characterization |
| 几种分子尺度润滑薄膜的制备和表征 学位论文 : 中国科学院研究生院, 2006 Authors: 庞重军 Adobe PDF(11579Kb)  |  Favorite  |  View/Download:235/0  |  Submit date:2013/05/24 分子润滑薄膜 制备与表征 全氟聚醚 角角分辨xps 薄膜厚度测定 Molecularly Thin Lubricating Film Preparation And Characterization Perfluoropolyether Angle-resolved Xps Film Thickness Measurement |