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化学结构化硅面表OTS自组装膜形貌及性能表征
Department固体润滑国家重点实验室
庞重军; 于波(男); 宋仕永; 巩育军
2007
Source Publication润滑与密封
ISSN0254-0150
Volume32Issue:11Pages:112-114
Abstract用40%NH4F对Si(100)表面进行化学织构化, 然后用十八烷基三氯硅烷(OTS)进行分子自组装, 在织构化表面谷底区域形成液体凝聚(LC)相分子薄膜。织构化表面的典型山丘直径约30 nm, 高约7 nm; 典型的LC相OTS单层膜原子力显微镜(AFM)厚度约213 nm。随着反应时间的延长, OTS薄膜的LC相面积覆盖率逐渐增加, 30min后达到70%左右的平衡值。OTS组装8 min后的表面静态接触角即达108°左右, 且表面接触角不再随反应时间的延长或LC相面积覆盖率的增加而明显变化。组装的OTS薄膜能显著改善织构化硅表面的摩擦学性能。
Keyword薄膜 自组装 Ots 形貌 性能表征 Thin Film Self-assembled Monolayer Topography Performance Characterization
Subject Area材料科学与物理化学
Funding Organization广东省自然科学基金项目(7010253);茂名学院博士启动基金项目(208032)
Indexed ByCSCD
Language中文
Funding Project空间润滑材料组
Citation statistics
Document Type期刊论文
Identifierhttp://ir.licp.cn/handle/362003/4162
Collection固体润滑国家重点实验室(LSL)
Recommended Citation
GB/T 7714
庞重军,于波(男),宋仕永,等. 化学结构化硅面表OTS自组装膜形貌及性能表征[J]. 润滑与密封,2007,32(11):112-114.
APA 庞重军,于波,宋仕永,&巩育军.(2007).化学结构化硅面表OTS自组装膜形貌及性能表征.润滑与密封,32(11),112-114.
MLA 庞重军,et al."化学结构化硅面表OTS自组装膜形貌及性能表征".润滑与密封 32.11(2007):112-114.
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