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中国科学院兰州化学物理研究所机构知识库
KMS Lanzhou Institute of Chemical Physics，Chinese Academy of Sciences
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固体润滑国家重点实验... [1]
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Microelect... [1]
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Chaohui Su [1]
Deyan He [1]
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2021 [1]
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Effects of heavy ion irradiation on Cu/Al2O3/Pt CBRAM devices
期刊论文
Microelectronic Engineering, 2021, 期号: 247, 页码: 111600
Authors:
Chaohui Su
;
Linbo Shan
;
Dongliang Yang
;
Yanfei Zhao
;
Yujun Fu
;
Jiande Liu
;
Guangan Zhang
;
Qi Wang
;
Deyan He
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Submit date：2021/12/08
