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一种采用价带谱进行X射线光电子能谱校正的方法
刘建; 郝俊英; 刘维民
2022-04-05
Rights Holder中国科学院兰州化学物理研究所 ; 青岛是资源化学与新材料研究中心
Country中国
Department固体润滑国家重点实验室
The second department润滑与防护薄膜课题组
Application Date2020-09-14
Patent NumberZL202010960652.5
Language中文
Status已授权
Document Type专利
Identifierhttp://ir.licp.cn/handle/362003/29169
Collection固体润滑国家重点实验室(LSL)
Recommended Citation
GB/T 7714
刘建,郝俊英,刘维民. 一种采用价带谱进行X射线光电子能谱校正的方法. ZL202010960652.5[P]. 2022-04-05.
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