| The Effects of Precursor C2H2 Fraction on Microstructure and Properties of Amorphous Carbon Composite Films Containing Si and Ag Prepared by Magnetron Sputtering Deposition | |
| Department | 固体润滑国家重点实验室 |
Xiaoqiang Liu（刘小强）1; Junying Hao（郝俊英）2 ; Yongjun Lv3; Xuejun Cui3
| |
| The second department | 润滑与防护薄膜研究组 |
| 2019 | |
| Source Publication | Nanomaterials
 |
| Issue | 9Pages:528 |
| If | 4.034 |
| compositor | 第二作者单位 |
| Document Type | 期刊论文 |
| Identifier | http://ir.licp.cn/handle/362003/25788 |
| Collection | 固体润滑国家重点实验室（LSL） |
| Corresponding Author | Xiaoqiang Liu（刘小强） |
| Affiliation | 1.School of Metallurgy and Chemical Engineering, Jiangxi University of Science and Technology 2.Material Corrosion and Protection Key Laboratory of Sichuan Province, School of Materials science and engineering, Sichuan University of Science & Engineering 3.State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences |
| Recommended Citation GB/T 7714 | Xiaoqiang Liu,Junying Hao,Yongjun Lv,et al. The Effects of Precursor C2H2 Fraction on Microstructure and Properties of Amorphous Carbon Composite Films Containing Si and Ag Prepared by Magnetron Sputtering Deposition[J]. Nanomaterials,2019(9):528. |
| APA | Xiaoqiang Liu,Junying Hao,Yongjun Lv,&Xuejun Cui.(2019).The Effects of Precursor C2H2 Fraction on Microstructure and Properties of Amorphous Carbon Composite Films Containing Si and Ag Prepared by Magnetron Sputtering Deposition.Nanomaterials(9),528. |
| MLA | Xiaoqiang Liu,et al."The Effects of Precursor C2H2 Fraction on Microstructure and Properties of Amorphous Carbon Composite Films Containing Si and Ag Prepared by Magnetron Sputtering Deposition".Nanomaterials .9(2019):528. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| nanomaterials-09-005（8383KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text | |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment